Test variables selection and multiple parametric faults detection in nonlinear analog circuits

---------------------------------------------------------------------***--------------------------------------------------------------------Abstract A method to select diagnosis variables or test variables for analog circuit testing and to diagnose multiple soft faults in non linear analog circuits using multiple frequency measurements is proposed in this paper. Circuit parameters or the test variables are derived by simulating the circuit under test (CUT) using Modified nodal analysis (MNA) method and are selected based on test vectors. Test vectors associated with each component of CUT are generated with the knowledge of circuit topology and the component values. Testing is performed at multiple frequency measurements to solve the component tolerance challenge in analog circuit testing. The results obtained from simulation of benchmark circuits show the effectiveness of the proposed approach